Component
nXL-3
300W level LD controller
Key Features
· Completion of localization
of 300W class control board
and completion of line verification
for hundreds of hours
· Maximize user convenience
by changing the LD fastening method
· Equipped with Pl Gain
control function, nXL-3 can
use it in various conditions
· Using as a processing
and SEED laser
· Possible
to Make custom drivers
APPLICATIONS
Specifications
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Measuring model Measuring technology Test content Measuring data
Large-area measurement with WSI interferometers
FOV extensive application
Micro Bump Height
Monolayer membrane thickness measurement
PCB fine pattern
Processed surface roughness measurement
Sensor step-difference measurement
Free-Form Metrology
Divided inspection possible according to product curve angels
Inspection of lens and glass, and measurement of shapes
Inspection of OLED surfaces, and measurement of shapes
Inspection of wafer surfaces, and measurement of shapes
Real-time measurement of transparent and semitransparent product thickness
Applicable to multi-channels
Measurement of wafer(silicone, sapphire) thickness
Measurement of glass and film thickness